ATR spectral intensity: What is the upper limit of weak absorption?

被引：9

作者：

Ekgasit, S ^{[1
]}

机构：

[1] Chulalongkorn Univ, Fac Sci, Dept Chem, Bangkok 10330, Thailand

来源：

APPLIED SPECTROSCOPY | 2000年 / 54卷 / 05期

关键词：

ATR/FT-IR spectroscopy; ATR spectral intensity; mean square evanescent field and mean square electric field;

D O I：

10.1366/0003702001950058

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A spectral simulation was used to theoretically verify the upper limit for the small absorption criteria of an attenuated total reflection (ATR) spectral intensity. Two systems were considered for this purpose, those with a germanium IRE and those with a zinc selenide IRE. Spectral intensities obtained at various absorption indices were compared.

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收藏

页码：756 / 758

页数：3

相关论文

共 23 条

[11] EXPANDED FORMULAS FOR ATTENUATED TOTAL REFLECTION AND DERIVATION OF ABSORPTION RULES FOR SINGLE AND MULTIPLE ATR SPECTROMETER CELLS [J].

HANSEN, WN .

SPECTROCHIMICA ACTA, 1965, 21 (04) :815-&

[12]

HANSEN WN, 1966, ANAL CHEM, V38, P1180

[13]

Harrick N.J., 1979, INTERNAL REFLECTION

[14] USE OF ATR-FTIR TO STUDY INTERDIFFUSION IN POLYSTYRENE AND POLY(VINYL METHYL-ETHER) [J].

JABBARI, E ;

PEPPAS, NA .

MACROMOLECULES, 1993, 26 (09) :2175-2186

[15] FTIR-ATR STUDIES ON LANGMUIR-BLODGETT-FILMS OF STEARIC-ACID WITH 1-9 MONOLAYERS [J].

KIMURA, F ;

UMEMURA, J ;

TAKENAKA, T .

LANGMUIR, 1986, 2 (01) :96-101

[16] A CRITICAL-EVALUATION OF INTERNAL-REFLECTION SPECTROSCOPIC METHODS FOR DETERMINING MACROMOLECULAR ORIENTATION IN POLYMER SURFACES [J].

MIRABELLA, FM .

APPLIED SPECTROSCOPY, 1988, 42 (07) :1258-1265

[17] QUANTITATIVE ATR SPECTROSCOPY - SOME BASIC CONSIDERATIONS [J].

MULLER, G ;

ABRAHAM, K ;

SCHALDACH, M .

APPLIED OPTICS, 1981, 20 (07) :1182-1190

[18] EXPERIMENTAL PROOF OF THE RELATION BETWEEN THICKNESS OF THE PROBED SURFACE-LAYER AND ABSORBANCE IN FT-IR ATR SPECTROSCOPY [J].

OHTA, K ;

IWAMOTO, R .

APPLIED SPECTROSCOPY, 1985, 39 (03) :418-425

[19] THEORETICAL DEVELOPMENT FOR DEPTH PROFILING OF STRATIFIED LAYERS USING VARIABLE-ANGLE ATR [J].

SHICK, RA ;

KOENIG, JL ;

ISHIDA, H .

APPLIED SPECTROSCOPY, 1993, 47 (08) :1237-1244

[20] PHYSICAL BASIS FOR ANALYSIS OF DEPTH OF ABSORBING SPECIES USING INTERNAL-REFLECTION SPECTROSCOPY [J].

TOMPKINS, HG .

APPLIED SPECTROSCOPY, 1974, 28 (04) :335-341