Reaction mechanism and electrical properties of (Ba, Sr)TiO3 films prepared by liquid source chemical vapor deposition

被引:48
作者
Yamamuka, M
Kawahara, T
Yuuki, A
Ono, K
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 4B期
关键词
DRAM; LSI; CVD; (Ba; Sr)TiO3; dielectric constant; dielectric loss tangent; leakage current; deposition rate; step coverage; sticking probability;
D O I
10.1143/JJAP.35.2530
中图分类号
O59 [应用物理学];
学科分类号
摘要
The reaction mechanism in liquid source chemical vapor deposition (CVD) of (Ba, Sr)TiO3 [BST] films has been studied using dipivaloylmethanato (DPM) source materials. Effects of substrate temperature and deposition atmosphere on film characteristics were investigated, such as deposition rate of each source material, step coverage, and electrical properties of the film deposited. The decomposition of DPM source materials for BST film deposition was found to be enhanced in O-2 atmosphere, as compared with that in N-2 atmosphere. Furthermore, the source materials were easier to decompose at higher substrate temperatures. The BST film step coverage became less conformal at higher temperatures and in O-2 atmosphere, implying that more precursors with large sticking probabilities were produced therein. Although O-2 gas was not necessary to form the BST crystalline structure and to improve the step coverage, the addition of O-2 during deposition was found to be necessary to improve the crystallinity and electrical properties of CVD-BST films.
引用
收藏
页码:2530 / 2535
页数:6
相关论文
共 20 条
[1]   DIELECTRIC-RELAXATION OF (BA,SR)TIO3 THIN-FILMS [J].
HORIKAWA, T ;
MAKITA, T ;
KUROIWA, T ;
MIKAMI, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (9B) :5478-5482
[2]  
Inuishi Y., 1973, YUDENTAI GENSHORON, P83
[3]  
KASHIHARA K, 1991, 1991 INT C SOL STAT, P192
[4]   PREPARATION OF (BA, SR)TIO3 THIN-FILMS BY CHEMICAL-VAPOR-DEPOSITION USING LIQUID SOURCES [J].
KAWAHARA, T ;
YAMAMUKA, M ;
MAKITA, T ;
TSUTAHARA, K ;
YUUKI, A ;
ONO, K ;
MATSUI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (10) :5897-5902
[5]   A STUDY ON THE BEHAVIOR OF SIO2 FILM PRECURSORS WITH TRENCH DEPOSITION METHOD FOR SIH4/O2 LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION [J].
KAWAHARA, T ;
YUUKI, A ;
MATSUI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1991, 30 (03) :431-436
[6]   STEP COVERAGE AND ELECTRICAL-PROPERTIES OF (BA, SR)TIO3 FILMS PREPARED BY LIQUID SOURCE CHEMICAL-VAPOR-DEPOSITION USING TIO(DPM)(2) [J].
KAWAHARA, T ;
YAMAMUKA, M ;
MAKITA, T ;
NAKA, J ;
YUUKI, A ;
MIKAMI, N ;
ONO, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B) :5129-5134
[7]  
KAWAHARA T, 1995, JPN J APPL PHYS PT 1, V34, P5081
[8]  
KIM TS, 1994, J VAC SCI TECHNOL, V12, P532
[9]   MOCVD OF BASRTIO3 FOR ULSI DRAMS [J].
KIRLIN, P ;
BILODEAU, S ;
VANBUSKIRK, P .
INTEGRATED FERROELECTRICS, 1995, 7 (1-4) :307-318
[10]   SrTiO3 thin films by MOCVD for 1 Gbit DRAM application [J].
Lesaicherre, PY ;
Yamaguchi, H ;
Miyasaka, Y ;
Watanabe, H ;
Ono, H ;
Yoshida, M .
INTEGRATED FERROELECTRICS, 1995, 8 (1-2) :201-+