Nitridation of the GaAs(001) surface: Thermal behavior of the (3x3) reconstruction and its evolution

被引:5
作者
Lu, J [1 ]
Haworth, L [1 ]
Hill, P [1 ]
Westwood, DI [1 ]
Macdonald, JE [1 ]
机构
[1] Univ Wales, Dept Phys & Astron, Cardiff CF2 3YB, S Glam, Wales
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1999年 / 17卷 / 04期
关键词
D O I
10.1116/1.590806
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The nitridation of the GaAs(001) surface using a radio frequency atomic nitrogen plasma source in a molecular beam epitaxy growth chamber has been studied. The resulting nitrogen induced GaAs(001) (3X3) reconstruction was investigated by in situ reflection high energy electron diffraction and x-ray photoemission spectroscopy (XPS). It was found that this reconstruction is only obtained in the temperature range 400-580 degrees C with a very low dose of atomic nitrogen. The nitrogen coverage corresponding to the (3X3) reconstruction was determined by quantitative XPS to be 0.30+/-0.09 ML, Below 400 degrees C an As-N species of disordered structure was found on the GaAs(001) surface. Subsequent annealing at about 500 degrees C produced the (3X3) reconstruction. Above 580 degrees C, nitridation lead to direct formation of beta-GaN islands. In addition, the (3X3) reconstruction was found to be unstable to both exposure to atomic hydrogen and annealing. The N desorption activation energy of the (3X3) was estimated to be 2.75+/-0.55 eV. A surface phase diagram of the (3X3) has thus been deduced. (C) 1999 American Vacuum Society. [S0734-211X(99)08804-6].
引用
收藏
页码:1659 / 1665
页数:7
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