On the measurement of electron impact ionisation cross-sections for highly charged ions using an electron beam ion trap (EBIT)

被引:7
作者
Sokell, E [1 ]
Currell, FJ
Shimizu, H
Ohtani, S
机构
[1] Univ Electrocommun, Inst Laser Sci, Chofu, Tokyo 1828585, Japan
[2] Japan Sci & Technol Corp, JST, ICORP, Cold Trapped Ion Project, Chofu, Tokyo 1820024, Japan
来源
PHYSICA SCRIPTA | 1999年 / T80B卷
关键词
D O I
10.1238/Physica.Topical.080a00289
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Experiments in which the time evolution of the charge distribution of Argon ions in the Tokyo EBIT was measured have been carried out. These measurements involved extracting the ions from the trap after a controlled confinement time and determining the charge distribution of these ions. By repeating the procedure at various confinement times the onsets for ions of particular charge states were determined at a series of electron beam energies. This sort of data should permit electron impact ionisation cross-sections to be determined as well as providing interesting information relating to EBIT physics.
引用
收藏
页码:289 / 291
页数:3
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