Extraction of trapped ions from the Tokyo Electron Beam Ion Trap

被引：5

作者：

Motohashi, K

Asada, J

Currell, FJ

Fukami, T

Hirayama, T

Mochiji, K

Nakamura, N

Nojikawa, E

Okazaki, K

Ohtani, S

Sakurai, M

Shiraishi, H

Tsurubuchi, S

Watanabe, H

机构：

[1] GAKUSHUIN UNIV,DEPT PHYS,TOKYO 171,JAPAN

[2] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

[3] RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN

[4] KOBE UNIV,DEPT PHYS,KOBE,HYOGO 657,JAPAN

[5] KYOTO UNIV,KYOTO 60601,JAPAN

[6] UNIV ELECTROCOMMUN,INST LASER SCI,CHOFU,TOKYO 182,JAPAN

来源：

PHYSICA SCRIPTA | 1997年 / T73卷

关键词：

D O I：

10.1088/0031-8949/1997/T73/121

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A beam line for transporting highly charged ions extracted from the Tokyo Electron Beam Ion Trap is being constructed in order to study ion-surface interactions and to inject into secondary ion traps for atomic physics experiments. A basic idea for the design and a computer modelling for the extraction system are described. The results of a test experiment to detect the total number of ions extracted from the EBIT are also reported.

引用

收藏

页码：368 / 370

页数：3

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