Photoemission electron microscopy of diindenoperylene thin films

被引：16

作者：

Casu, M. B. ^{[1
]}

Biswas, I. ^{[1
]}

Nagel, M. ^{[1
]}

Nagel, P.

Schuppler, S. ^{[2
]}

Chasse, T. ^{[1
]}

机构：

[1] Univ Tubingen, Inst Phys & Theoret Chem, D-72076 Tubingen, Germany

[2] Forschungszentrum Karlsruhe, Inst Festkorperphys, D-76021 Karlsruhe, Germany

来源：

PHYSICAL REVIEW B | 2008年 / 78卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.78.075310

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present the results of photoemission electron microscopy investigations of diindenoperylene thin films deposited by organic molecular-beam deposition on polycrystalline gold at room temperature. Our findings revealed the existence of a different molecular orientation, besides the already known X and (T phases, characterized by an intermediate tilt angle. In thicker film regions, the energy of the films is minimized by a molecular arrangement that has an asymptotic tendency to the upright standing position. We have interpreted our results by using basic concepts in terms of relative strength of the substrate-molecule and molecule-molecule interactions.

引用

页数：7

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