Quantitative adhesion measures of multilayer films: Part I. Indentation mechanics

被引:130
作者
Kriese, MD [1 ]
Gerberich, WW
Moody, NR
机构
[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[2] Sandia Natl Labs, Livermore, CA 94551 USA
关键词
D O I
10.1557/JMR.1999.0404
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The mechanics for calculating the quantitative driving force of indentation-induced delamination of thin-film multilayers is presented. The solution is based on the mechanics developed by Marshall and Evans [D.B. Marshall and A.G. Evans, J. Appl. Phys. 56, 2632 (1984).] and extended to the general case of a multilayer by use of standard bending and thin-plate analyses. Presented and discussed are the specific solutions for the bilayer case that show that in the limit of zero thickness of either layer, the solution converges to the single-layer case. In the range of finite thickness, the presence of the superlayer increases the driving force relative to that possible for the original film alone and can be optimized to the experimental situation by proper choice of thickness, elastic constants, and residual stress. The companion paper "Quantitative adhesion measures of multilayer films: Part II. Indentation of W/Cu, W/W, Cr/W" discusses experimental results with copper, tungsten, and chromium thin films.
引用
收藏
页码:3007 / 3018
页数:12
相关论文
共 43 条
[1]  
Agarwal BhagwanD., 1990, ANAL PERFORMANCE FIB
[2]   THE EDGE CRACKING AND DECOHESION OF THIN-FILMS [J].
AKISANYA, AR ;
FLECK, NA .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1994, 31 (23) :3175-3199
[3]   ANALYSIS OF CRITICAL DEBONDING PRESSURES OF STRESSED THIN-FILMS IN THE BLISTER TEST [J].
ALLEN, MG ;
SENTURIA, SD .
JOURNAL OF ADHESION, 1988, 25 (04) :303-315
[4]   APPLICATION OF THE ISLAND BLISTER TEST FOR THIN-FILM ADHESION MEASUREMENT [J].
ALLEN, MG ;
SENTURIA, SD .
JOURNAL OF ADHESION, 1989, 29 (1-4) :219-231
[5]   A NEW PROCEDURE FOR MEASURING THE DECOHESION ENERGY FOR THIN DUCTILE FILMS ON SUBSTRATES [J].
BAGCHI, A ;
LUCAS, GE ;
SUO, Z ;
EVANS, AG .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (07) :1734-1741
[6]   Measurements of the debond energy for thin metallization lines on dielectrics [J].
Bagchi, A ;
Evans, AG .
THIN SOLID FILMS, 1996, 286 (1-2) :203-212
[7]   Adhesion and acoustic emission analysis of failures in nitride films with 14 metal interlayer [J].
Bahr, DF ;
Hoehn, JW ;
Moody, NR ;
Gerberich, WW .
ACTA MATERIALIA, 1997, 45 (12) :5163-5175
[8]  
BAHR DF, 1996, MATER RES SOC S P, V436, P85
[9]   MECHANICAL-PROPERTIES OF COMPOSITIONALLY MODULATED AU-NI THIN-FILMS - NANOINDENTATION AND MICROCANTILEVER DEFLECTION EXPERIMENTS [J].
BAKER, SP ;
NIX, WD .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (12) :3131-3145
[10]   Limitations on the use of the mixed-mode delaminating beam test specimen: Effects of the size of the region of K-dominance [J].
Becker, TL ;
McNaney, JM ;
Cannon, RM ;
Ritchie, RO .
MECHANICS OF MATERIALS, 1997, 25 (04) :291-308