Selective processing of individual carbon nanotubes using dual-nanomanipulator installed in transmission electron microscope

被引：25

作者：

Kuzumaki, T

Sawada, H

Ichinose, H

Horiike, Y

Kizuka, T

机构：

[1] Univ Tokyo, Grad Sch Engn, Dept Mat Sci, Bunkyo Ku, Tokyo 1138656, Japan

[2] Nagoya Univ, Dept Appl Phys, Chikusa Ku, Nagoya, Aichi 4648603, Japan

[3] Nagoya Univ, Res Ctr Adv Waste & Emiss Management, Chikusa Ku, Nagoya, Aichi 4648603, Japan

[4] Japan Sci & Technol Corp, Precursory Res Embryon Sci & Technol, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 27期

关键词：

D O I：

10.1063/1.1430022

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanoscale processings such as deformation, cutting off, and bonding of individual carbon nanotubes (NTs) have been selectively performed using a dual-nanomanipulation system installed in a high-resolution transmission electron microscope. These processes are directly observed in situ at a lattice resolution of 0.1 nm. At high applied electric field between the NT tip and Au tip, we have found a carbon monolayer extending out from the carbon cluster which was deposited on the NT tip. The cutting off and bonding of individual NT tips can be performed by contacting the NT tips and the opposite nanometer-sized tips at an applied bias voltage. The threshold voltage of the processing is approximately 2 V. (C) 2001 American Institute of Physics.

引用

页码：4580 / 4582

页数：3

共 20 条

[11] Structural change at the carbon-nanotube tip by field emission [J].