Optical characterization of the silicon photodiodes for the establishment of national radiometric standards

被引:15
作者
Durak, M [1 ]
Aslan, MH
机构
[1] TUBITAKE, UME, Natl Metrol Inst Turkey, Gebze, Turkey
[2] Gebze Inst Technol, Dept Phys, Gebze, Turkey
关键词
silicon photodiodes; spectral responsivity; spatial uniformity; trap detectors;
D O I
10.1016/j.optlastec.2003.08.009
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical properties of the silicon photodiodes are investigated in the visible spectral regime. Non-linearity measurement standard was established by using Hamamatsu S1337-11 type windowless silicon photodiode whose non-linearity value was found to be better than 6 x 10(-5) at photocurrent level of 10(-9) to 10(-4) A. Temperature effects on the spectral responsivity for S1337-11, S1337-1010BQ and S1227-1010BQ type photodiodes were analyzed between 20degreesC and 40degreesC at 488.1, 514.7 and 632.8 nm vacuum wavelengths. The spatial uniformities of the responsivity for three type photodiodes are performed with a laser beam having I mm diameter by using home made two-axis micro translation system. Results of the reflectance measurements for three elements of reflection-based trap detectors were compared with the predicted values obtained from Fresnel equations. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:223 / 227
页数:5
相关论文
共 7 条
[1]  
Durak M., 2002, Turkish Journal of Physics, V26, P375
[2]   PHOTODIODE NONLINEARITY MEASUREMENT WITH AN INTENSITY STABILIZED LASER AS A RADIATION SOURCE [J].
FISCHER, J ;
FU, L .
APPLIED OPTICS, 1993, 32 (22) :4187-4190
[3]  
Jellison G. E. Jr., 1992, Optical Materials, V1, P41, DOI 10.1016/0925-3467(92)90015-F
[4]   The NIST high accuracy scale for absolute spectral response from 406 nm to 920 nm [J].
Larason, TC ;
Bruce, SS ;
Cromer, CL .
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1996, 101 (02) :133-140
[5]   A CRYOGENIC RADIOMETER FOR ABSOLUTE RADIOMETRIC MEASUREMENTS [J].
MARTIN, JE ;
FOX, NP ;
KEY, PJ .
METROLOGIA, 1985, 21 (03) :147-155
[6]  
SCHROTER W, 1998, MAT SCI TECHNOLOGY C, V4, P220
[7]   UNIFORMITY OF QUANTUM EFFICIENCY OF SINGLE AND TRAP-CONFIGURED SILICON PHOTODIODES [J].
WHITE, MG ;
BITTAR, A .
METROLOGIA, 1993, 30 (04) :361-364