Feasibility study of online high-spatial-resolution MOSFET dosimetry in static and pulsed X-ray radiation fields

被引：49

作者：

Rosenfeld, AB ^{[1
]}

Lerch, MLF

Kron, T

Brauer-Krisch, E

Bravin, A

Holmes-Siedle, A

Allen, BJ

机构：

[1] Univ Wollongong, Ctr Med Radiat Phys, Wollongong, NSW 2522, Australia

[2] Mater Hosp, Newcastle, NSW, Australia

[3] Installat Europeenne Rayonnment Synchrotron, ESRF, F-38043 Grenoble, France

[4] REM Oxford Ltd, Oxford OX29 4PD, England

[5] St George Canc Care Ctr, Sydney, NSW, Australia

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2001年 / 48卷 / 06期

关键词：

D O I：

10.1109/23.983173

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Improvements have been made in the measurement of dose profiles in several types of X-ray beams. These include 120-kVp X-ray beams from an orthovoltage X-ray machine, 6-MV Bremsstrablung from a medical LINAC in conformal mode and the 50-200 keV energy spectrum of microbeams produced at the medical beamline station of the European Synchrotron Radiation Facility. Using a quadruple metal-oxide-semiconductor field-effect transistor (MOSFET) sensor chip in ''edge on'' mode together with a newly developed sensor readout system, the feasibility of online scanning of the profiles of quasi-static and pulsed radiation beams was demonstrated. Measurements of synchrotron pulsed microbeams showed that a micrometer-scale spatial resolution was achievable. The use of several MOSFETs on the same chip gave rise to the correction of misalignments of the oxide films of the sensor with respect to the microbeam, ensuring that the excellent spatial resolution of the MOSFET used in ''edge-on'' mode was fully utilized.

引用

页码：2061 / 2068

页数：8

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