Polarized neutron reflectometry study of an exchange biased Fe3O4/NiO multilayer

被引：22

作者：

Ball, AR

Leenaers, AJG

vanderZaag, PJ

Shaw, KA

Singer, B

Lind, DM

Frederikze, H

Rekveldt, MT

机构：

[1] PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS

[2] FLORIDA STATE UNIV,DEPT PHYS,TALLAHASSEE,FL 32306

[3] DELFT UNIV TECHNOL,INTERFAC REACTOR INST,NL-2629 JB DELFT,NETHERLANDS

来源：

APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 10期

关键词：

D O I：

10.1063/1.116917

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Polarized neutron reflectometry was performed on a [Fe3O4/NiO](x15) multilayer, molecular beam epitaxy grown on a (001) MgO substrate, in both exchange biased and nonexchange biased states. The Fe3O4 layers exhibit a depth-dependent magnetic profile characterized by a change in the magnetization near the Fe3O4/NiO interfaces. In the exchange biased state, measurements performed in the two saturated states of the magnetic hysteresis loop reveal magnetic differences in the Fe3O4, possibly due to the interfacial domain wall formation in the ferromagnetic layer. (C) 1996 American Institute of Physics.

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页码：1489 / 1491

页数：3

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