Gigabit-per-second, ECL-compatible I/O interface in 0.35-μm CMOS

被引:8
作者
Djahanshahi, H [1 ]
Hansen, F
Salama, CAT
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5G 3G4, Canada
[2] Vitesse Semicond Corp, Camarillo, CA 93012 USA
基金
加拿大自然科学与工程研究理事会;
关键词
CMOS; input/output (I/O); pseudo-emitter-coupled logic;
D O I
10.1109/4.777105
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents high-speed differential input and output (I/O) interface circuits for gigabit-per-second serial data communication. The circuits are implemented in a 3.3-V/0.35-mu m CMOS process. Signal levels are compatible with industry standards for low-voltage positive emitter-coupled logic (ECL), with the possibility of ac-coupling to standard ECL systems. A differential open-drain circuit with pulsed bias and active pullups offers significantly improved speed performance for a transmitter and creates wide open eye patterns. Combining circuit techniques with the features of a submicrometer technology, the presented I/O blocks enable a full-CMOS chip to communicate with highspeed ECL-compatible systems and ease up a common I/O-related speed bottleneck. The circuits operate at 622 Mb/s (OC-12) and 1.24 Gb/s (OC-24) in a repeater and a retimer configuration. The asynchronous performance of the receiver and the transmitter was tested at rates up to 2.5 Gb/s.
引用
收藏
页码:1074 / 1083
页数:10
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