Full frequency back-action spectrum of a single-electron transistor during qubit readout -: art. no. 046802

被引:51
作者
Johansson, G [1 ]
Käck, A
Wendin, G
机构
[1] Chalmers, Microtechnol Ctr Chalmers MC2, Dept Microelect & Nanosci, S-41296 Gothenburg, Sweden
[2] Univ Gothenburg, S-41296 Gothenburg, Sweden
关键词
D O I
10.1103/PhysRevLett.88.046802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We calculate the spectral density of voltage fluctuations in a single-electron transistor (SET), biased to operate in a transport mode where tunneling events are correlated due to Coulomb interaction. The whole spectrum from low frequency shot noise to quantum noise at frequencies comparable to the SET charging energy (E-c/(h) over bar) is considered. We discuss the back-action during readout of a charge qubit and conclude that single-shot readout is possible using the radio-frequency SET.
引用
收藏
页数:4
相关论文
共 17 条
  • [1] Radio-frequency single-electron transistor as readout device for qubits: Charge sensitivity and backaction
    Aassime, A
    Johansson, G
    Wendin, G
    Schoelkopf, RJ
    Delsing, P
    [J]. PHYSICAL REVIEW LETTERS, 2001, 86 (15) : 3376 - 3379
  • [2] AVERIN DV, CONDMAT0010052
  • [3] Quantum coherence with a single Cooper pair
    Bouchiat, V
    Vion, D
    Joyez, P
    Esteve, D
    Devoret, MH
    [J]. PHYSICA SCRIPTA, 1998, T76 : 165 - 170
  • [4] Amplifying quantum signals with the single-electron transistor
    Devoret, MH
    Schoelkopf, RJ
    [J]. NATURE, 2000, 406 (6799) : 1039 - 1046
  • [5] FINITE-FREQUENCY SHOT-NOISE IN A CORRELATED TUNNELING CURRENT
    HANKE, U
    GALPERIN, YM
    CHAO, KA
    ZOU, NZ
    [J]. PHYSICAL REVIEW B, 1993, 48 (23) : 17209 - 17216
  • [6] Single-spin measurement using single-electron transistors to probe two-electron systems
    Kane, BE
    McAlpine, NS
    Dzurak, AS
    Clark, RG
    Milburn, GJ
    Sun, HB
    Wiseman, H
    [J]. PHYSICAL REVIEW B, 2000, 61 (04): : 2961 - 2972
  • [7] INTRINSIC NOISE OF THE SINGLE-ELECTRON TRANSISTOR
    KOROTKOV, AN
    [J]. PHYSICAL REVIEW B, 1994, 49 (15): : 10381 - 10392
  • [8] KOROTKOV AN, 1992, SPRIN S ELE, V31, P45
  • [9] Lea MJ, 2000, FORTSCHR PHYS, V48, P1109, DOI 10.1002/1521-3978(200009)48:9/11<1109::AID-PROP1109>3.0.CO
  • [10] 2-I