Observations of GaAs/CaF2 heterointerface formation by electron beam surface modification and its effects

被引:7
作者
Kawasaki, K
Tsutsui, K
机构
[1] Department of Applied Electronics, Interdisc. Grad. Sch. Sci. and Eng., Tokyo Institute of Technology, Yokohama, 226, 4259 Nagatsuta, Midori-ku
关键词
heterointerface; surface modification; GaAs; CaF2; electron beam;
D O I
10.1016/S0169-4332(97)80177-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We investigated the electron beam induced surface modification of CaF2(111) and initial stage of GaAs growth on the modified CaF2 surface using the surface photoabsorption (SPA) method and atomic force microscopy (AFM). The CaF2 surface was modified by 300 eV electron beam irradiation at 200 degrees C in a As-4 molecular beam. The amount of adsorbed As atoms increased with electron dose and it follows Langmuir adsorption principle and saturated at a value equivalent to 1 monolayer (ML) adsorption. AFM observation of GaAs grown on this modified surface clarified that the sticking coefficient and the wettability of GaAs on CaF2 surface was drastically improved by the surface modification.
引用
收藏
页码:753 / 757
页数:5
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