Homojunction and heterojunction silicon solar cells deposited by low temperature-high frequency plasma enhanced chemical vapour deposition

被引:25
作者
Plá, J
Centurioni, E
Summonte, C
Rizzoli, R
Migliori, A
Desalvo, A
Zignani, F
机构
[1] CNR Lamel, I-40129 Bologna, Italy
[2] Univ Bologna, Dipartimento Chim Applicata & Sci Mat, I-40136 Bologna, Italy
关键词
solar cells; plasma processing and deposition; microcrystalline silicon; heterostructures;
D O I
10.1016/S0040-6090(01)01709-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Plasma enhanced chemical vapour deposition (PECVD) is widely used to deposit materials on a variety of substrates at low temperature. However, examples of epitaxial growth on silicon with this technique are scarce. In this paper, we present homojunction silicon solar cells, epitaxially grown by PECVD, and muc-Si/a-Si:H/c-Si heterojunctions deposited with the same technique, manufactured by a completely low temperature process. All cells incorporate an intrinsic buffer layer, whose deposition conditions were varied. It is shown that the best V-oc is obtained when the intrinsic layer is deposited under two extreme conditions, i.e. zero or very high (99.4%) hydrogen dilution of the gas mixture, resulting in a totally amorphous or epitaxial i-layer, respectively. Intermediate conditions result in V-oc degradation. Efficiencies as high as 13.7% were obtained in planar devices that include an amorphous i-layer, and 13.1% in homojunction devices. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:248 / 255
页数:8
相关论文
共 23 条
[2]  
Centurioni E, 1999, MATER RES SOC SYMP P, V536, P517
[3]   Photovoltaic materials, past, present, future [J].
Goetzberger, A ;
Hebling, C .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2000, 62 (1-2) :1-19
[4]   ENHANCEMENT OF OPEN CIRCUIT VOLTAGE IN HIGH-EFFICIENCY AMORPHOUS-SILICON ALLOY SOLAR-CELLS [J].
GUHA, S ;
YANG, J ;
NATH, P ;
HACK, M .
APPLIED PHYSICS LETTERS, 1986, 49 (04) :218-219
[5]  
Howling A.A., 2000, P 16 EUR PHOT SOL EN, P518
[6]   OPTICAL FUNCTIONS OF CHEMICAL-VAPOR-DEPOSITED THIN-FILM SILICON DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY [J].
JELLISON, GE ;
CHISHOLM, MF ;
GORBATKIN, SM .
APPLIED PHYSICS LETTERS, 1993, 62 (25) :3348-3350
[7]   Recombination mechanisms in amorphous silicon/crystalline silicon heterojunction solar cells [J].
Jensen, N ;
Rau, U ;
Hausner, RM ;
Uppal, S ;
Oberbeck, L ;
Bergmann, RB ;
Werner, JH .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (05) :2639-2645
[8]   In situ observation of low temperature growth of crystalline silicon using reflection high-energy electron diffraction [J].
Kitagawa, T ;
Kondo, M ;
Matsuda, A .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 :64-68
[9]  
Lips K, 1999, MATER RES SOC SYMP P, V536, P457
[10]   ELECTRICAL AND STRUCTURAL-PROPERTIES OF PHOSPHOROUS-DOPED GLOW-DISCHARGE SI-F-H AND SI-H FILMS [J].
MATSUDA, A ;
YAMASAKI, S ;
NAKAGAWA, K ;
OKUSHI, H ;
TANAKA, K ;
IIZIMA, S ;
MATSUMURA, M ;
YAMAMOTO, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) :L305-L308