Effects of process parameters on structure and magnetic properties of sputtered Ni-Zn ferrite thin films

被引:28
作者
Lee, JS [1 ]
Lee, BI [1 ]
Joo, SK [1 ]
机构
[1] Seoul Natl Univ, Coll Engn, Sch MS&E, Kwanak Ku, Seoul 151742, South Korea
关键词
Ni-Zn ferrite; spinel structure; sputtering; thin film;
D O I
10.1109/20.800542
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ni-Zn ferrite thin films were prepared by RF magnetron sputtering tit room temperature. The structure and magnetic properties of the as-deposited films were investigated as a function of oxygen partial pressure, working pressure and RF power. Deposition conditions greatly affect the crystallinity and magnetic properties of the Ni-Zn ferrite thin films. Ni-Zn ferrite thin films with spinel structure could be obtained by adjusting the process parameters without substrate heating or post heat treatment. The Ni-Zn ferrite thin film deposited with the optimized condition at room temperature showed saturation magnetization of 170 emu/cm(3) and coercivity of 35 Oe.
引用
收藏
页码:3415 / 3417
页数:3
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