Improved imaging of soft materials with modified AFM tips

被引：33

作者：

Piner, RD ^{[1
]}

Hong, S ^{[1
]}

Mirkin, CA ^{[1
]}

机构：

[1] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA

来源：

LANGMUIR | 1999年 / 15卷 / 17期

关键词：

D O I：

10.1021/la990408d

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Herein, we report a simple method for making silicon nitride tips hydrophobic without significantly changing their shape. Specifically, we show that atomic force microscope (AFM) tips coated with physisorbed multilayers of 1-dodecylamine, when used in air, offer enhanced resolution for both organic and inorganic materials. The reason for this is due to a significant reduction in the capillary effect associated with water condensation between the tip and substrate.

引用

收藏

页码：5457 / 5460

页数：4

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