Atomic force microscopy of work functions on the nanometer scale

被引：25

作者：

O'Boyle, MP

Hwang, TT

Wickramasinghe, HK

机构：

[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA

[2] IBM Corp, Hopewell Junction, NY 12533 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 18期

关键词：

D O I：

10.1063/1.123923

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The Kelvin probe force microscope, introduced some years ago, has opened up several avenues of investigation. In this letter, we demonstrate that the technique is capable of distinguishing constituents of a metal alloy through their work-function differences. The intermetallics in the alloy are clearly resolved. We discuss the basic principles of the measurement technique and present our results on aluminum/copper surfaces. The limits of the technique are also discussed. (C) 1999 American Institute of Physics. [S0003-6951(99)04117-0].

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页码：2641 / 2642

页数：2

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