Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through focal series

被引：28

作者：

Bhattacharyya, Somnath ^{[1
]}

Koch, Christoph T. ^{[1
]}

Ruehle, Manfred ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

ULTRAMICROSCOPY | 2006年 / 106卷 / 06期

关键词：

transmission electron microscopy; exit face wave function; projected potential profile; interfaces; through focal series; phase retrieval; Fresnel imaging; in-line holography;

D O I：

10.1016/j.ultramic.2006.01.007

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An iterative method for reconstructing the exit face wave function from a through focal series of transmission electron microscopy image line profiles across an interface is presented. Apart from high-resolution images recorded with small changes in defocus, this method works also well for a large defocus range as used for Fresnel imaging. Using the phase-object approximation the projected electrostatic as well as the absorptive potential profiles across an interface are determined from this exit face wave function. A new experimental image alignment procedure was developed in order to align images with large relative defocus shift. The performance of this procedure is shown to be superior to other image alignment procedures existing in the literature. The reconstruction method is applied to both simulated and experimental images. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：525 / 538

页数：14

共 31 条

[11] Potential barrier formation at a metal-semiconductor contact using selective removal of atoms [J].

Gurovich, BA ;

Aronzon, BA ;

Ryl'kov, VV ;

Ol'shanskii, ED ;

Kuleshova, EA ;

Dolgii, DI ;

Kovalev, DY ;

Filippov, VI .

SEMICONDUCTORS, 2004, 38 (09) :1036-1040

[12]

ISHIZUKA K, 2005, MICROSC TODAY MAY, P22

[13] Fresnel contrast analysis of composition changes and space charge at grain boundaries in mullite [J].

Kara, F ;

DuninBorkowski, RE ;

Boothroyd, CB ;

Little, JA ;

Stobbs, WM .

ULTRAMICROSCOPY, 1996, 66 (1-2) :59-71

[14] IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .1. THEORY [J].

KIRKLAND, EJ .

ULTRAMICROSCOPY, 1984, 15 (03) :151-172

[15]

KOCH CT, 2005, IN PRESS MICROSC MIC

[16] STRUCTURAL AND ELECTRON-DIFFRACTION DATA FOR SAPPHIRE (ALPHA-AL2O3) [J].

LEE, WE ;

LAGERLOF, KPD .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985, 2 (03) :247-258

[17]

Levin I, 1998, J AM CERAM SOC, V81, P1995, DOI 10.1111/j.1151-2916.1998.tb02581.x

[18] A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations [J].

Meyer, RR ;

Kirkland, AI ;

Saxton, WO .

ULTRAMICROSCOPY, 2002, 92 (02) :89-109

[19] A TEM FRESNEL DIFFRACTION-BASED METHOD FOR CHARACTERIZING THIN GRAIN-BOUNDARY AND INTERFACIAL FILMS [J].

NESS, JN ;

STOBBS, WM ;

PAGE, TF .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 54 (05) :679-702

[20]

NUCHTER W, 1997, THESIS U STUTTGART, P41

← 1 2 3 4 →