Fast neutron-induced damage in INTEGRAL n-type HPGe detectors

被引：20

作者：

Borrel, V

Kandel, B

Albernhe, F

Frabel, P

Cordier, B

Tauzin, G

Crespin, S

Coszach, R

Denis, JM

Leleux, P

机构：

[1] CESR, F-31028 Toulouse 4, France

[2] CEA Saclay, DSM, DAPNIA, SAp, F-91191 Gif Sur Yvette, France

[3] CEA Bruyeres, DAM, DPTA, F-91180 Bruyeres Le Chatel, France

[4] Inst Phys Nucl, B-1348 Louvain, Belgium

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1999年 / 430卷 / 2-3期

关键词：

n-type HPGe detectors; fast neutron damage;

D O I：

10.1016/S0168-9002(99)00218-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Several INTEGRAL n-type HPGe detectors have been irradiated by fast neutrons and their degradation studied through the analysis of line shapes. The availability of three different fast neutron beams (5, 16 and 6-70 MeV) allowed a quantitative analysis of the importance of the neutron energy on the amount of damage. A comparison is made with the degradation induced by high-energy proton irradiations. Transient effects on the measured resolution are reported after high voltage cut-off on degraded detectors. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：348 / 362

页数：15

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