PROTON-INDUCED RADIATION-DAMAGE IN GERMANIUM DETECTORS

被引:32
作者
BRUCKNER, J
KORFER, M
WANKE, H
SCHROEDER, ANF
FILGES, D
DRAGOVITSCH, P
ENGLERT, PAJ
STARR, R
TROMBKA, JI
TAYLOR, I
DRAKE, DM
SHUNK, ER
机构
[1] PRINCETON GAMMA TECH, PRINCETON, NJ 08540 USA
[2] UNIV COLOGNE, W-5000 COLOGNE 41, GERMANY
[3] FORSCHUNGSZENTRUM JULICH, INST KERNPHYS, W-5170 JULICH 1, GERMANY
[4] SAN JOSE STATE UNIV, SAN JOSE, CA 95192 USA
[5] NASA, GODDARD SPACE FLIGHT CTR, GREENBELT, MD 20771 USA
[6] CATHOLIC UNIV AMER, WASHINGTON, DC 20064 USA
[7] UNIV CALIF LOS ALAMOS SCI LAB, LOS ALAMOS, NM 87545 USA
基金
美国国家航空航天局;
关键词
D O I
10.1109/23.289298
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10(8) protons cm-2 (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific as well as engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage the detectors were stepwise annealed at temperatures T less-than-or-equal-to 110-degrees-C while staying in their specially designed cryostats. This study shows that n-type HPGe detectors can be used in charged particle environments as high-energy resolution devices until a certain level of radiation damage is accumulated and that the damage can be removed at moderate annealing temperatures and the detector returned to operating condition.
引用
收藏
页码:209 / 217
页数:9
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