Quantum metrology

被引：1909

作者：

Giovannetti, V

Lloyd, S

Maccone, L

机构：

[1] INFM, NEST, CNR, I-56126 Pisa, Italy

[2] Scuola Normale Super Pisa, I-56126 Pisa, Italy

[3] MIT, Elect Res Lab, Cambridge, MA 02139 USA

[4] Dept Mech Engn, Cambridge, MA 02139 USA

[5] Univ Pavia, Dipartimento Fis A Volta, QUIT, Quantum Informat Theory Grp, I-27100 Pavia, Italy

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.96.010401

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

引用

页数：4

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