Polychromatic light interferometer for high-accuracy positioning

被引:8
作者
Dobosz, M [1 ]
Matsumoto, H [1 ]
Seta, K [1 ]
Iwasaki, S [1 ]
机构
[1] NATL RES LAB METROL,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1016/0143-8166(95)00016-H
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Superposition of different-wavelength, multimode- and single-mode laser diode beams is investigated to locate the fringe of zero interference order in a Twyman-Green interferometer. The possibility of central fringe detection using three multimode laser diodes or one single-mode together with a pair of multimode laser diodes is shown. If a single-mode laser diode is applied, a simultaneous fringe-counting technique for displacement measurement is available. The influence of the angle between wavefronts entering the interferometer is analyzed. A repeatability of about 5 nm is shown for surface position determination when using three-beam source.
引用
收藏
页码:43 / 56
页数:14
相关论文
共 12 条
[1]  
CATHEY WT, 1974, OPTICAL INFORMATION, P51
[2]   INSTANTANEOUS FRINGE-ORDER IDENTIFICATION USING DUAL BROAD-BAND SOURCES WITH WIDELY SPACED WAVELENGTHS [J].
CHEN, S ;
GRATTAN, KTV ;
MEGGITT, BT ;
PALMER, AW .
ELECTRONICS LETTERS, 1993, 29 (04) :334-335
[3]   3-COLOR LASER-DIODE INTERFEROMETER [J].
DEGROOT, P .
APPLIED OPTICS, 1991, 30 (25) :3612-3616
[4]  
DOBOSZ M, 1995, OPT ENG, V35, P493
[5]   BEAMSPLITTER CUBE FOR WHITE-LIGHT INTERFEROMETRY [J].
FARR, KB ;
GEORGE, N .
OPTICAL ENGINEERING, 1992, 31 (10) :2191-2196
[6]   GAUGE-BLOCK INTERFEROMETER BASED ON ONE STABILIZED LASER AND A WHITE-LIGHT SOURCE [J].
IKONEN, E ;
RISKI, K .
METROLOGIA, 1993, 30 (02) :95-104
[7]   2-WAVELENGTH LASER-DIODE INTERFEROMETRY THAT USES PHASE-SHIFTING TECHNIQUES [J].
ISHII, Y ;
ONODERA, R .
OPTICS LETTERS, 1991, 16 (19) :1523-1525
[8]  
Palmer C. H., 1962, OPTICS EXPT DEMONSTR, P147
[9]   SYNTHESIZED SOURCE FOR WHITE-LIGHT SENSING SYSTEMS [J].
RAO, YJ ;
NING, YN ;
JACKSON, DA .
OPTICS LETTERS, 1993, 18 (06) :462-464
[10]   2-WAVELENGTH SINUSOIDAL PHASE MODULATING LASER-DIODE INTERFEROMETER INSENSITIVE TO EXTERNAL DISTURBANCES [J].
SASAKI, O ;
SASAZAKI, H ;
SUZUKI, T .
APPLIED OPTICS, 1991, 30 (28) :4040-4045