Alpha particle response characterization of CdZnTe

被引:15
作者
Amman, M [1 ]
Lee, JS [1 ]
Luke, PN [1 ]
机构
[1] Univ Calif Berkeley, Ernest Orlando Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
来源
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS III | 2001年 / 4507卷
关键词
CdZnTe; coplanar grid; semiconductor detector; gamma-ray detector; alpha particle;
D O I
10.1117/12.450742
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The coplanar-grid as well as other electron-only detection techniques are effective in overcoming some of the material problems of CdZnTe and, consequently, have led to efficient gamma-ray detectors with good energy resolution while operating at room temperature. The performance of these detectors is limited by the degree of uniformity in both electron generation and transport. Despite recent progress in the growth of CdZnTe material, small variations in these properties remain a barrier to the widespread success of such detectors. Alpha-particle response characterization of CdZnTe crystals fabricated into simple planar detectors is an effective tool to accurately study electron generation and transport. We have used a finely collimated alpha source to produce two-dimensional maps of detector response. A clear correlation has been observed between the distribution of precipitates near the entrance contact on some crystals and their alpha-response maps. Further studies are ongoing to determine the mechanism for the observed response variations and the reason for the correlation. This paper presents the results of these studies and their relationship to coplanar-grid gamma-ray detector performance.
引用
收藏
页码:1 / 11
页数:11
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