Formation and phase transition of VO2 precipitates embedded in sapphire

被引:17
作者
Gea, LA [1 ]
Budai, JD [1 ]
Boatner, LA [1 ]
机构
[1] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
关键词
D O I
10.1557/JMR.1999.0348
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Crystallographically coherent precipitates of vanadium dioxide (VO2) have been formed in the near-surface region of single crystals of sapphire (Al2O3) using a combination of ion implantation and thermal treatments. As in the case of either bulk VO2 single crystals or thin films of VO2, the thermally induced semiconductor-ro-metal phase transition of the embedded VO2 precipitates is accompanied by a large hysteretic change in the infrared optical transmission. The VO2 precipitate transition temperature (T-c, = 72 to 85 degrees C) is higher than that of bulk VO2 (T-c = 68 degrees C) and is sensitive to the implantation conditions. The present results show that the damage resulting from the coimplantation of vanadium and oxygen into an Al2O3 host lattice dictates the final microstructure of the VO2 precipitates and, consequently, affects the transition temperature, as well as the optical quality of the VO2/Al2O3 surface-nanocomposite precipitate system.
引用
收藏
页码:2602 / 2610
页数:9
相关论文
共 22 条
[1]   Controlling the size, structure and orientation of semiconductor nanocrystals using metastable phase recrystallization [J].
Budai, JD ;
White, CW ;
Withrow, SP ;
Chisholm, MF ;
Zhu, J ;
Zuhr, RA .
NATURE, 1997, 390 (6658) :384-386
[2]   MODIFICATIONS IN THE PHASE-TRANSITION PROPERTIES OF PREDEPOSITED VO-2 FILMS [J].
CASE, FC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (04) :1509-1512
[3]   IMPROVED VO2 THIN-FILMS FOR INFRARED SWITCHING [J].
CASE, FC .
APPLIED OPTICS, 1991, 30 (28) :4119-4123
[4]   EPITAXIAL TIO2 AND VO2 FILMS PREPARED BY MOCVD [J].
CHANG, HLM ;
YOU, H ;
GUO, J ;
LAM, DJ .
APPLIED SURFACE SCIENCE, 1991, 48-9 :12-18
[5]   Mid-infrared properties of a VO2 film near the metal-insulator transition [J].
Choi, HS ;
Ahn, JS ;
Jung, JH ;
Noh, TW ;
Kim, DH .
PHYSICAL REVIEW B, 1996, 54 (07) :4621-4628
[6]   FORMATION AND CHARACTERIZATION OF GRAIN-ORIENTED VO2 THIN-FILMS [J].
DENATALE, JF ;
HOOD, PJ ;
HARKER, AB .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (12) :5844-5850
[7]   Optical switching of coherent VO2 precipitates formed in sapphire by ion implantation and annealing [J].
Gea, LA ;
Boatner, LA .
APPLIED PHYSICS LETTERS, 1996, 68 (22) :3081-3083
[8]  
Gea LA, 1995, MATER RES SOC SYMP P, V354, P269
[9]  
Gea LA, 1996, MATER RES SOC SYMP P, V396, P215
[10]   2 COMPONENTS OF CRYSTALLOGRAPHIC TRANSITION IN VO2 [J].
GOODENOUGH, JB .
JOURNAL OF SOLID STATE CHEMISTRY, 1971, 3 (04) :490-+