FORMATION AND CHARACTERIZATION OF GRAIN-ORIENTED VO2 THIN-FILMS

被引：159

作者：

DENATALE, JF

HOOD, PJ

HARKER, AB

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 12期

关键词：

D O I：

10.1063/1.343605

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5844 / 5850

页数：7

共 30 条

[1]

BERGLUND CN, 1969, PHYS REV, V185, P1022, DOI 10.1103/PhysRev.185.1022

[2] INFLUENCE OF ION-BEAM PARAMETERS ON THE ELECTRICAL AND OPTICAL-PROPERTIES OF ION-ASSISTED REACTIVELY EVAPORATED VANADIUM DIOXIDE THIN-FILMS [J].

CASE, FC .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :1762-1766

[3] MODIFICATIONS IN THE PHASE-TRANSITION PROPERTIES OF PREDEPOSITED VO-2 FILMS [J].

CASE, FC .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (04) :1509-1512

[4] SIMPLE RESISTANCE MODEL FIT TO THE OXIDATION OF A VANADIUM FILM INTO VO2 [J].

CASE, FC .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (01) :123-127

[5] REACTIVE EVAPORATION OF ANOMALOUS BLUE VO2 [J].

CASE, FC .

APPLIED OPTICS, 1987, 26 (08) :1550-1553

[6] TOTAL TRANSMISSION OF ANOMALOUS BLUE VO2 THIN-FILMS [J].

CASE, FC .

APPLIED OPTICS, 1988, 27 (09) :1803-1806

[7] EFFECTS OF OXYGEN IN ION-BEAM SPUTTER DEPOSITION OF VANADIUM-OXIDE [J].

CHAIN, EE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (04) :1836-1839

[8] THE INFLUENCE OF DEPOSITION TEMPERATURE ON THE STRUCTURE AND OPTICAL-PROPERTIES OF VANADIUM-OXIDE FILMS [J].

CHAIN, EE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1986, 4 (03) :432-435

[9]

Cullity B.D., 1978, ELEMENTS XRAY DIFFRA

[10] PREPARATION OF VO2 THIN-FILM AND ITS DIRECT OPTICAL BIT RECORDING CHARACTERISTICS [J].

FUKUMA, M ;

ZEMBUTSU, S ;

MIYAZAWA, S .

APPLIED OPTICS, 1983, 22 (02) :265-268

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