PREPARATION OF VO2 THIN-FILM AND ITS DIRECT OPTICAL BIT RECORDING CHARACTERISTICS

被引:75
作者
FUKUMA, M [1 ]
ZEMBUTSU, S [1 ]
MIYAZAWA, S [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP,IBARAKI ELECT COMMUN LABS,TOKAI,IBARAKI 31911,JAPAN
来源
APPLIED OPTICS | 1983年 / 22卷 / 02期
关键词
D O I
10.1364/AO.22.000265
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:265 / 268
页数:4
相关论文
共 15 条
  • [1] HIGH-DENSITY OPTICAL-RECORDING WITH (GA,AL)AS DH LASERS
    ASBECK, PM
    CAMMACK, DA
    DANIELE, JJ
    LOU, D
    HEEMSKERK, JPJ
    KLEUTERS, WJ
    OPHEY, WH
    [J]. APPLIED PHYSICS LETTERS, 1979, 34 (12) : 835 - 837
  • [2] HIGHER FI BY DIGITS
    BERNHARD, R
    [J]. IEEE SPECTRUM, 1979, 16 (12) : 28 - 32
  • [3] 10-BILLION BITS ON A DISK
    BULTHUIS, K
    CARASSO, MG
    HEEMSKERK, JPJ
    KIVITS, PJ
    KLEUTERS, WJ
    ZALM, P
    [J]. IEEE SPECTRUM, 1979, 16 (08) : 26 - 33
  • [4] RF AND DC REACTIVE SPUTTERING FOR CRYSTALLINE AND AMORPHOUS VO2 THIN-FILM DEPOSITION
    DUCHENE, J
    TERRAILLON, M
    PAILLY, M
    [J]. THIN SOLID FILMS, 1972, 12 (02) : 231 - +
  • [5] EDEN DD, 1981, OPT ENG, V20, P337
  • [6] REACTIVELY SPUTTERED VANADIUM DIOXIDE THIN FILMS
    FULS, EN
    HENSLER, DH
    ROSS, AR
    [J]. APPLIED PHYSICS LETTERS, 1967, 10 (07) : 199 - &
  • [7] MAGNETIC, ELECTRICAL AND THERMAL STUDIES ON V1-XMOX02 SYSTEM WITH 0 LESS THAN OR EQUAL TO X LESS THAN OR EQUAL TO 0.20
    HORLIN, T
    NIKLEWSKI, T
    NYGREN, M
    [J]. MATERIALS RESEARCH BULLETIN, 1973, 8 (02) : 179 - 189
  • [8] BEHAVIOR OF VANADIUM DIOXIDE SINGLE-CRYSTALS SYNTHESIZED UNDER VARIOUS OXYGEN PARTIAL PRESSURES AT 1500-K
    KIMIZUKA, N
    ISHII, M
    KAWADA, I
    SAEKI, M
    NAKAHIRA, M
    [J]. JOURNAL OF SOLID STATE CHEMISTRY, 1974, 9 (01) : 69 - 77
  • [9] SELF-COUPLED OPTICAL PICKUP
    MITSUHASHI, Y
    MORIKAWA, T
    SAKURAI, K
    SEKO, A
    SHIMADA, J
    [J]. OPTICS COMMUNICATIONS, 1976, 17 (01) : 95 - 97
  • [10] A DTA STUDY OF SEMICONDUCTOR-METALLIC TRANSITION TEMPERATURE IN V1-XWX02, O[=X[=O.067
    NYGREN, M
    ISRAELSSON, M
    [J]. MATERIALS RESEARCH BULLETIN, 1969, 4 (12) : 881 - +