Near-field infrared imaging and spectroscopy of a thin film polystyrene/poly(ethyl acrylate) blend

被引:13
作者
Michaels, CA [1 ]
Gu, XH
Chase, DB
Stranick, SJ
机构
[1] NIST, Gaithersburg, MD 20899 USA
[2] DuPont Co Inc, Cent Res & Dev, Wilmington, DE 19880 USA
关键词
near-field optical microscopy; infrared microscopy; chemical imaging;
D O I
10.1366/000370204322886582
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The application of broadband, near-field infrared microscopy to the characterization of the mesoscale structure of a thin film polymer blend is described. Key features of this instrument, which couples the nanoscale spatial resolution of scanning probe microscopy with the chemical specificity of vibrational spectroscopy, include broad tunability and bandwidth, parallel spectral detection for high image acquisition rates, and infrared-transparent aperture probes. Nearfield spectral transmission images of a thin film of polystyrene/ poly(ethyl acrylate) acquired in the C-H stretching region are reported. An assessment of the relative importance of transmission image contrast mechanisms is a significant aim of this work. Analysis of the near-field infrared spectra indicates that the image contrast in the C-H stretching region is largely due to near-held coupling and/or scattering effects. Identification and differentiation of the operative contrast mechanisms on the basis of their relative dependence on wavelength is discussed. Analysis of the contrast attributed to absorption is consistent with the chemical morphology of this sample derived from previous chemical modification/atomic force microscopy studies.
引用
收藏
页码:257 / 263
页数:7
相关论文
共 43 条
[1]   Near-field scanning microwave probe based on a dielectric resonator [J].
Abu-Teir, M ;
Golosovsky, M ;
Davidov, D ;
Frenkel, A ;
Goldberger, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (04) :2073-2079
[2]   Apertureless scanning near-field infrared microscopy of a rough polymeric surface [J].
Akhremitchev, BB ;
Pollack, S ;
Walker, GC .
LANGMUIR, 2001, 17 (09) :2774-2781
[3]   NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT [J].
BACHELOT, R ;
GLEYZES, P ;
BOCCARA, AC .
OPTICS LETTERS, 1995, 20 (18) :1924-1926
[4]   An easy-to-use non-optical shear-force distance control for near-field optical microscopes [J].
Barenz, J ;
Hollricher, O ;
Marti, O .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (05) :1912-1916
[5]   AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE [J].
BESOCKE, K .
SURFACE SCIENCE, 1987, 181 (1-2) :145-153
[6]   COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
FINN, PL ;
WEINER, JS .
APPLIED PHYSICS LETTERS, 1992, 60 (20) :2484-2486
[7]   Second-harmonic imaging of ferroelectric domain walls [J].
Bozhevolnyi, SI ;
Hvam, JM ;
Pedersen, K ;
Laurell, F ;
Karlsson, H ;
Skettrup, T ;
Belmonte, M .
APPLIED PHYSICS LETTERS, 1998, 73 (13) :1814-1816
[8]  
Brandrup J., 1999, Polymer handbook, VII
[9]   Transmission near-field scanning microscope for infrared chemical imaging [J].
Dragnea, B ;
Preusser, J ;
Schade, W ;
Leone, SR ;
Hinsberg, WD .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (05) :2795-2799
[10]   Near-field surface-enhanced Raman spectroscopy on single silver nanoparticles [J].
Emory, SR ;
Nie, SM .
ANALYTICAL CHEMISTRY, 1997, 69 (14) :2631-2635