In situ hot-stage ESEM evaluation of CeO2 buffer layers on Ni tapes for YBCO coated conductors

CeO2 coatings have been prepared on Ni tapes from solutions derived from Cc-based precursors using a sol-gel method for YBCO coated conductors. The surface morphology and structure of coatings were characterized using in situ Hot-Stage Environmental Scanning Electron Microscope (ESEM) and X-ray diffraction (XRD). Crack size and crack propagation rate of these coatings were determined using in situ Hot-Stage ESEM depending on temperature at certain time. It has been found that the size and propagation rate of cracks of these coatings increased with increasing process temperature. (C) 2002 Elsevier Science B.V. All rights reserved.