Electric-Field Screening in Atomically Thin Layers of MoS2: the Role of Interlayer Coupling

被引：142

作者：

Castellanos-Gomez, Andres ^{[1
]}

Cappelluti, Emmanuele ^{[2
,3
]}

Roldan, Rafael ^{[2
]}

Agrait, Nicolas ^{[4
,5
]}

Guinea, Francisco ^{[2
]}

Rubio-Bollinger, Gabino ^{[5
]}

机构：

[1] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands

[2] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain

[3] CNR, ISC, I-00185 Rome, Italy

[4] Inst Madrileno Estudios Avanzados Nanociencia IMD, E-28049 Madrid, Spain

[5] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

来源：

ADVANCED MATERIALS | 2013年 / 25卷 / 06期

关键词：

electric-field screening; MoS2; two-dimensional crystals; ThomasFermi theory; electrostatic force microscopy (EFM); MECHANICAL-PROPERTIES; BAND-STRUCTURES; MONOLAYER MOS2; GRAPHENE;

D O I：

10.1002/adma.201203731

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.

引用

页码：899 / 903

页数：5

共 44 条

[41] Atomically-thin crystalline films and ribbons of bismuth telluride [J].

Teweldebrhan, Desalegne ;

Goyal, Vivek ;

Rahman, Muhammad ;

Balandin, Alexander A. .

APPLIED PHYSICS LETTERS, 2010, 96 (05)

[42] Integrated Circuits Based on Bilayer MoS2 Transistors [J].

Wang, Han ;

Yu, Lili ;

Lee, Yi-Hsien ;

Shi, Yumeng ;

Hsu, Allen ;

Chin, Matthew L. ;

Li, Lain-Jong ;

Dubey, Madan ;

Kong, Jing ;

Palacios, Tomas .

NANO LETTERS, 2012, 12 (09) :4674-4680

[43] Single-Layer MoS2 Phototransistors [J].

Yin, Zongyou ;

Li, Hai ;

Li, Hong ;

Jiang, Lin ;

Shi, Yumeng ;

Sun, Yinghui ;

Lu, Gang ;

Zhang, Qing ;

Chen, Xiaodong ;

Zhang, Hua .

ACS NANO, 2012, 6 (01) :74-80

[44] Origin of spatial charge inhomogeneity in graphene [J].

Zhang, Yuanbo ;

Brar, Victor W. ;

Girit, Caglar ;

Zettl, Alex ;

Crommie, Michael F. .

NATURE PHYSICS, 2009, 5 (10) :722-726

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