Irradiation damage in GaAs particle detectors

被引：4

作者：

Brozel, MR

机构：

[1] Centre for Electronic Materials, UMIST

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1997年 / 395卷 / 01期

关键词：

irradiation damage; GaAs; particle detectors;

D O I：

10.1016/S0168-9002(97)00623-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

GaAs particle detectors for use in the LHC at CERN will be subject to a considerable fluence of energetic particles. In this note, possible effects of this irradiation on the production of damage centres in these detectors will be discussed.

引用

页码：88 / 93

页数：6

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