Interface dynamics for copper electrodeposition: The role of organic additives in the growth mode

被引:13
作者
de Leon, PFJ
Albano, EV
Salvarezza, RC
Solari, HG
机构
[1] Natl Univ La Plata, CONICET, Inst Invest Fisicoquim Teor & Aplicadas, RA-1900 La Plata, Argentina
[2] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, RA-1428 Buenos Aires, DF, Argentina
来源
PHYSICAL REVIEW E | 2002年 / 66卷 / 04期
关键词
D O I
10.1103/PhysRevE.66.042601
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
An atomistic model for Cu electrodeposition under nonequilibrium conditions is presented. Cu electrodeposition takes place with a height-dependent deposition rate that accounts for fluctuations in the local Cu2+ ions concentration at the interface, followed by surface diffusion. This model leads to an unstable interface with the development of protrusions and grooves. Subsequently the model is extended to account for the presence of organic additives, which compete with Cu2+ for adsorption at protrusions, leading to a stable interface with scaling exponents consistent with those of the Edwards-Wilkinson equation. The model reproduces the interface evolution experimentally observed for Cu electrodeposition in the absence and in the presence of organic additives.
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页数:4
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共 24 条
[1]   Kinetics of particle coarsening at gold electrode/electrolyte solution interfaces followed by in situ scanning tunneling microscopy [J].
Andreasen, G ;
Nazzarro, M ;
Ramirez, J ;
Salvarezza, RC ;
Arvia, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (02) :466-471
[2]   Scanning tunneling microscopy studies of the electrochemical reactivity of thiourea on Au(111) electrodes [J].
Azzaroni, O ;
Andreasen, G ;
Blum, B ;
Salvarezza, RC ;
Arvia, AJ .
JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (07) :1395-1398
[3]   Atomistic mechanism of surfactant-assisted epitaxial growth [J].
Camarero, J ;
Ferron, J ;
Cros, V ;
Gomez, L ;
de Parga, ALV ;
Gallego, JM ;
Prieto, JE ;
de Miguel, JJ ;
Miranda, R .
PHYSICAL REVIEW LETTERS, 1998, 81 (04) :850-853
[4]  
Despic A. R., 1983, Comprehensive Treatise of Electrochemistry: Volume 7 Kinetics and Mechanisms of Electrode Processes, P451, DOI DOI 10.1007/978-1-4613-3584-9_8
[5]   THE SURFACE STATISTICS OF A GRANULAR AGGREGATE [J].
EDWARDS, SF ;
WILKINSON, DR .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 381 (1780) :17-31
[6]   DYNAMIC SCALING AND PHASE-TRANSITIONS IN INTERFACE GROWTH [J].
FAMILY, F .
PHYSICA A, 1990, 168 (01) :561-580
[7]   Anomalous scaling of the surface width during Cu electrodeposition [J].
Huo, S ;
Schwarzacher, W .
PHYSICAL REVIEW LETTERS, 2001, 86 (02) :256-259
[8]   STABLE GROWTH AND KINETIC ROUGHENING IN ELECTROCHEMICAL DEPOSITION [J].
IWAMOTO, A ;
YOSHINOBU, T ;
IWASAKI, H .
PHYSICAL REVIEW LETTERS, 1994, 72 (25) :4025-4028
[9]   Superconformal electrodeposition in submicron features [J].
Josell, D ;
Wheeler, D ;
Huber, WH ;
Moffat, TP .
PHYSICAL REVIEW LETTERS, 2001, 87 (01) :1-016102
[10]   Experimental demonstration of diffusion-limited dynamics in electrodeposition [J].
Leger, C ;
Elezgaray, J ;
Argoul, F .
PHYSICAL REVIEW LETTERS, 1997, 78 (26) :5010-5013