Local measurement of secondary electron emission from ZnO-coated carbon nanotubes

被引：24

作者：

Huang, L ^{[1
]}

Lau, SP ^{[1
]}

Yang, HY ^{[1
]}

Yu, SF ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

来源：

NANOTECHNOLOGY | 2006年 / 17卷 / 06期

关键词：

D O I：

10.1088/0957-4484/17/6/005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.

引用

页码：1564 / 1567

页数：4

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