Improved spatial resolution in magnetic force microscopy

被引：64

作者：

Skidmore, GD

DanDahlberg, E

机构：

[1] Magnetic Microscopy Center, School of Physics and Astronomy, University of Minnesota, Minneapolis

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 22期

关键词：

D O I：

10.1063/1.120316

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron beam deposited spikes for use in magnetic force microscopy have been grown onto atomic force microscope tips and coated with magnetic thin films using thermal evaporation. The resulting magnetically active regions are a close approximation to monopoles or dipoles located on the very end of the spikes. We show that these tips image with increased spatial resolution and less sample perturbation than the standard, commercially available tips. (C) 1997 American Institute of Physics.

引用

页码：3293 / 3295

页数：3

共 11 条

[1] NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY
AKAMA, Y
NISHIMURA, E
SAKAI, A
MURAKAMI, H
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 429 - 433
[2] OPTIMIZATION OF THIN-FILM TIPS FOR MAGNETIC FORCE MICROSCOPY
BABCOCK, K
ELINGS, V
DUGAS, M
LOPER, S
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) : 4503 - 4505
[3] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[4] ELECTRON-BEAM FABRICATION OF 80-A METAL STRUCTURES
BROERS, AN
MOLZEN, WW
CUOMO, JJ
WITTELS, ND
[J]. APPLIED PHYSICS LETTERS, 1976, 29 (09) : 596 - 598
[5] Nanotubes as nanoprobes in scanning probe microscopy
Dai, HJ
Hafner, JH
Rinzler, AG
Colbert, DT
Smalley, RE
[J]. NATURE, 1996, 384 (6605) : 147 - 150
[6] ULTRAHIGH-RESOLUTION MAGNETIC FORCE MICROSCOPE TIP FABRICATED USING ELECTRON-BEAM LITHOGRAPHY
FISCHER, PB
WEI, MS
CHOU, SY
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06): : 2570 - 2573
[7] MAGNETIC FORCE MICROSCOPY USING ELECTRON-BEAM FABRICATED TIPS
RUHRIG, M
PORTHUN, S
LODDER, JC
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (10) : 3224 - 3228
[8] Electron beam fabrication and characterization of high-resolution magnetic force microscopy tips
Ruhrig, M
Porthun, S
Lodder, JC
McVitie, S
Heyderman, LJ
Johnston, AB
Chapman, JN
[J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (06) : 2913 - 2919
[9] SCANNING PROBE TIP GEOMETRY OPTIMIZED FOR METROLOGY BY FOCUSED ION-BEAM ION MILLING
VASILE, MJ
GRIGG, D
GRIFFITH, JE
FITZGERALD, E
RUSSELL, PE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3569 - 3572
[10] MICROMACHINED SILICON SENSORS FOR SCANNING FORCE MICROSCOPY
WOLTER, O
BAYER, T
GRESCHNER, J
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1353 - 1357

← 1 2 →