The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors

被引:12
作者
Zandbergen, HW
Bokel, R
Connolly, E
Jansen, J
机构
[1] Delft Univ Technol, Mat Sci Lab, Natl Ctr HREM, NL-2628 AL Delft, Netherlands
[2] Univ Antwerp, Ruca, B-2020 Antwerp, Belgium
关键词
electron microscopy; through focus exit wave reconstruction; atomic structure determination; superconducting films;
D O I
10.1016/S0968-4328(99)00042-6
中图分类号
TH742 [显微镜];
学科分类号
摘要
The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that combination of the amplitude and phase information of the exit waves at various thicknesses allows one to determine the positions of all atoms. Whereas the light atoms can be best distinguished in the phase image of a somewhat thicker part of a crystal, the heavy atoms can be observed most reliably in the amplitude part. In particular the change of the exit wave with thickness was found to be very useful in the determination of the presence of light atoms. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:395 / 416
页数:22
相关论文
共 41 条
[1]  
BOKEL RMJ, 1998, UNPUB ULTRAMICROSCOP
[2]  
BOKEL RMJ, 1998, P 14 INT C EL MICR C, V2, P407
[3]   SUPERCONDUCTIVITY IN LANTHANUM NICKEL BORO-NITRIDE [J].
CAVA, RJ ;
ZANDBERGEN, HW ;
BATLOGG, B ;
EISAKI, H ;
TAKAGI, H ;
KRAJEWSKI, JJ ;
PECK, WF ;
GYORGY, EM ;
UCHIDA, S .
NATURE, 1994, 372 (6503) :245-247
[4]   Enhancement of T-c of CyCu1-yBa2Ca2Cu3Ox from 67 K to 120 K by reduction treatments [J].
Chaillout, C ;
Le Floch, S ;
Gautier, E ;
Bordet, P ;
Acha, C ;
Feng, Y ;
Sulpice, A ;
Tholence, JL ;
Marezio, M .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 1996, 266 (3-4) :215-222
[5]   PHASE RETRIEVAL THROUGH FOCUS VARIATION FOR ULTRA-RESOLUTION IN FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPY [J].
COENE, W ;
JANSSEN, G ;
DEBEECK, MO ;
VANDYCK, D .
PHYSICAL REVIEW LETTERS, 1992, 69 (26) :3743-3746
[6]  
COENE W, 1992, SCANNING MICROSCOPY, V6, P379
[7]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .3. SINGLE-CRYSTAL DIFFRACTION PATTERNS [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (05) :360-367
[8]  
Dorset D. L., 1995, STRUCTURAL ELECT CRY
[9]  
FRYER JR, 1992, T AM CRYSTALLOGR ASS, V28, P57
[10]   An improvement of surface smoothness and lattice match of CeO2 buffer layers on R-sapphire processed by MOCVD [J].
Graboy, IE ;
Markov, NV ;
Maleev, VV ;
Kaul, AR ;
Polyakov, SN ;
Svetchnikov, VL ;
Zandbergen, HW ;
Dahmen, KH .
JOURNAL OF ALLOYS AND COMPOUNDS, 1997, 251 (1-2) :318-321