High resolution transmission electron microscopy characterization of fcc→9R transformation in nanocrystalline palladium films due to hydriding

被引：21

作者：

Amin-Ahmadi, Behnam ^{[1
]}

Idrissi, Hosni ^{[1
,2
]}

Delmelle, Renaud ^{[2
]}

Pardoen, Thomas ^{[2
]}

Proost, Joris ^{[2
]}

Schryvers, Dominique ^{[1
]}

机构：

[1] Univ Antwerp, Electron Microscopy Mat Sci EMAT, Dept Phys, B-2020 Antwerp, Belgium

[2] Catholic Univ Louvain, Inst Mech Mat & Civil Engn, B-1348 Louvain, Belgium

来源：

APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 07期

关键词：

INCOHERENT TWIN BOUNDARY; NANOSCALE TWINS; GRAIN-BOUNDARY; ULTRAHIGH-STRENGTH; GROWTH TWINS; THIN-FILMS; COPPER; METALS; CU; DISLOCATIONS;

D O I：

10.1063/1.4793512

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Sputtered nanocrystalline palladium thin films with nanoscale growth twins have been subjected to hydriding cycles. The evolution of the twin boundaries has been investigated using high resolution transmission electron microscopy. Surprisingly, the Sigma 3{112} incoherent twin boundaries dissociate after hydriding into two phase boundaries bounding a 9R phase. This phase which corresponds to single stacking faults located every three {111} planes in the fcc Pd structure was not expected because of the high stacking fault energy of Pd. This observation is connected to the influence of the Hydrogen on the stacking fault energy of palladium and the high compressive stresses building up during hydriding. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793512]

引用

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