Micrometer-scale tensile testing of biological attachment devices

被引：35

作者：

Orso, S ^{[1
]}

Wegst, UGK ^{[1
]}

Eberl, C ^{[1
]}

Arzt, E ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

ADVANCED MATERIALS | 2006年 / 18卷 / 07期

关键词：

D O I：

10.1002/adma.200501807

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Using a focused ion beam system as an in situ laboratory for sample preparation, fixation, and testing at the micrometer scale, the mechanical properties of microscopic biological and technical samples can be measured in tension, bending, and compression. Samples such as individual hairs of the brush-like attachment systems of insects and geckos (see figure), natural and biomimetic spider silk, and carbon nanotubes can be measured with this method.

引用

页码：874 / +

页数：5

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