Nanoscale capacitors based on metal-insulator-carbon nanotube-metal structures

被引:30
作者
Jang, JE [1 ]
Cha, SN
Choi, Y
Amaratunga, GAJ
Kang, DJ
Hasko, DG
Jung, JE
Kim, JM
机构
[1] Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England
[2] Sungkyunkwan Univ, Sungkyunkwan Adv Inst Nanotechnol, Suwon 440746, South Korea
[3] Sungkyunkwan Univ, Dept Phys, Suwon 440746, South Korea
[4] Univ Cambridge, Cavendish Lab, Ctr Microelect Res, Cambridge CB3 0HE, England
[5] Samsung Adv Inst Technol, Yongin 449712, South Korea
关键词
D O I
10.1063/1.2149982
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the fabrication process and the electrical characteristics of a nanocapacitor structure using metal-insulator-carbon nanotube-metal layers. The structure shows high capacitance and the possibility of ultrahigh integration density due to the unique nanotube structure. Nanoscale and high-aspect-ratio patterns are achieved by electron beam lithography for the fabrication of these vertical nanostructures. This structure can be substituted for capacitors based on the silicon pillar structure in dynamic random access memory or as a nanoscale capacitor for various nanoelectronic devices. (c) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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