Soft computing applications in high impedance fault detection in distribution systems

被引:37
作者
Sedighi, AR
Haghifam, MR [1 ]
Malik, OP
机构
[1] Univ Calgary, Dept Elect & Comp Engn, Calgary, AB T2N 1N4, Canada
[2] Tarbiat Modares Univ, Dept Elect Engn, Tehran, Iran
关键词
Bayes classifier; high impedance fault; genetic algorithm; neural network; principal component analysis; wavelet transform;
D O I
10.1016/j.epsr.2005.05.004
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two methods, one based on genetic algorithm (GA) and one based on neural networks (NN), are proposed for high impedance fault (HIF) detection in distribution systems. These methods are used to discriminate HIFs from isolator leakage current (ILC) and transients such as capacitor switching, load switching (high/low voltage), ground fault, inrush current and no load line switching. Wavelet transform is used for the decomposition of signals and feature extraction in both methods. In one method, GA is used for feature vector reduction and Bayes for classification. In the other method, principal component analysis (PCA) is applied for feature vector reduction and NN for classification. HIF and ILC data was acquired by experimental tests and the data for other faults was obtained by simulating a real network using EMTP. Results show that either of the proposed procedures can be used to identify HIF from other events efficiently. (C) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:136 / 144
页数:9
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