Scanning Photoemission Microscopy of Graphene Sheets on SiO2

被引：40

作者：

Kim, Ki-Jeong ^{[1
,2
,3
]}

Lee, Hangil ^{[3
]}

Choi, Jae-Hyun ^{[4
]}

Youn, Young-Sang ^{[1
,2
]}

Choi, Junghun ^{[1
,2
]}

Lee, Hankoo ^{[4
]}

Kang, Tai-Hee ^{[3
]}

Jung, M. C. ^{[3
]}

Shin, H. J. ^{[3
]}

Lee, Hu-Jong ^{[4
]}

Kim, Sehun ^{[1
,2
]}

Kim, Bongsoo ^{[3
,4
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Chem, Taejon 305701, South Korea

[2] Korea Adv Inst Sci & Technol, Sch Mol Sci BK21, Taejon 305701, South Korea

[3] POSTECH, Pohang Accelerator Lab, Pohang 790784, Kyungbuk, South Korea

[4] POSTECH, Dept Phys, Pohang 790784, Kyungbuk, South Korea

来源：

ADVANCED MATERIALS | 2008年 / 20卷 / 19期

关键词：

D O I：

10.1002/adma.200800742

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.

引用

页码：3589 / +

页数：4

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