Localized optical phenomena and the characterization of materials interfaces

被引：18

作者：

Bohn, PW ^{[1
]}

机构：

[1] UNIV ILLINOIS, BECKMAN INST, URBANA, IL 61801 USA

来源：

ANNUAL REVIEW OF MATERIALS SCIENCE | 1997年 / 27卷

关键词：

Raman scattering; surface plasmons; waveguides; near-field scanning; optical microscopy; interfaces; electronic materials; infrared spectroscopy;

D O I：

10.1146/annurev.matsci.27.1.469

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This review focuses on the characterization of interfaces, specifically on the optical methods of characterization that utilize some form of spatial localization to circumvent the special problems accruing to interfaces. Experiments utilizing radiation in only the infrared through the ultraviolet regions of the electromagnetic spectrum are considered. We specifically exclude the vast and important array of experimental techniques that utilize the vacuum ultraviolet and X-ray spectral regions. In addition, the interfaces considered are those composed of solids with liquids, thin films, and other solids, thus largely ignoring the literature of ultrahigh vacuum surface science.

引用

页码：469 / 498

页数：30

共 291 条

[1] ELECTRONIC RAMAN-SCATTERING AT DISORDERED NOBLE-METAL AND ALKALI-METAL SURFACES
AKEMANN, W
OTTO, A
[J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1994, 70 (03): : 747 - 760
[2] ALTERATIONS OF SINGLE-MOLECULE FLUORESCENCE LIFETIMES IN NEAR-FIELD OPTICAL MICROSCOPY
AMBROSE, WP
GOODWIN, PM
MARTIN, JC
KELLER, RA
[J]. SCIENCE, 1994, 265 (5170) : 364 - 367
[3] SIMULTANEOUS REAL-TIME SPECTROSCOPIC ELLIPSOMETRY AND REFLECTANCE FOR MONITORING THIN-FILM PREPARATION
AN, I
NGUYEN, HV
HEYD, AR
COLLINS, RW
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (11) : 3489 - 3500
[4] SPECTROSCOPIC ELLIPSOMETRY ON THE MILLISECOND TIME SCALE FOR REAL-TIME INVESTIGATIONS OF THIN-FILM AND SURFACE PHENOMENA
AN, I
LI, YM
NGUYEN, HV
COLLINS, RW
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (08) : 3842 - 3848
[5] REAL-TIME SPECTROELLIPSOMETRY STUDY OF THE INTERACTION OF HYDROGEN WITH ZNO DURING ZNO A-SI1-XCXH INTERFACE FORMATION
AN, I
LU, YW
WRONSKI, CR
COLLINS, RW
[J]. APPLIED PHYSICS LETTERS, 1994, 64 (24) : 3317 - 3319
[6] ENHANCED RAMAN-SCATTERING FROM BENZENE CONDENSED ON A SILVER GRATING
ARNOLD, M
BUSSEMER, P
HEHL, K
GRABHORN, H
OTTO, A
[J]. JOURNAL OF MODERN OPTICS, 1992, 39 (11) : 2329 - 2346
[7] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE
ASH, EA
NICHOLLS, G
[J]. NATURE, 1972, 237 (5357) : 510 - &
[8] REAL-TIME OPTICAL DIAGNOSTICS FOR EPITAXIAL-GROWTH
ASPNES, DE
[J]. SURFACE SCIENCE, 1994, 307 : 1017 - 1027
[9] AS CAPTURE AND THE GROWTH OF ULTRATHIN INAS LAYERS ON INP
ASPNES, DE
TAMARGO, MC
BRASIL, MJSP
NAHORY, RE
SCHWARZ, SA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04): : 1180 - 1185
[10] INFLUENCE OF SPATIALLY DEPENDENT PERTURBATIONS ON MODULATED REFLECTANCE AND ABSORPTION OF SOLIDS (REPRINTED IN SOLID-STATE COMMUN, VOL 7, PG 155-159, 1969)
ASPNES, DE
FROVA, A
[J]. SOLID STATE COMMUNICATIONS, 1993, 88 (11-12) : 1061 - 1065

← 1 2 3 4 5 6 7 8 9 10 →