Localized optical phenomena and the characterization of materials interfaces

被引:18
作者
Bohn, PW [1 ]
机构
[1] UNIV ILLINOIS, BECKMAN INST, URBANA, IL 61801 USA
来源
ANNUAL REVIEW OF MATERIALS SCIENCE | 1997年 / 27卷
关键词
Raman scattering; surface plasmons; waveguides; near-field scanning; optical microscopy; interfaces; electronic materials; infrared spectroscopy;
D O I
10.1146/annurev.matsci.27.1.469
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This review focuses on the characterization of interfaces, specifically on the optical methods of characterization that utilize some form of spatial localization to circumvent the special problems accruing to interfaces. Experiments utilizing radiation in only the infrared through the ultraviolet regions of the electromagnetic spectrum are considered. We specifically exclude the vast and important array of experimental techniques that utilize the vacuum ultraviolet and X-ray spectral regions. In addition, the interfaces considered are those composed of solids with liquids, thin films, and other solids, thus largely ignoring the literature of ultrahigh vacuum surface science.
引用
收藏
页码:469 / 498
页数:30
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