Molecularly resolved observation of surface reconstruction of C-60 epitaxial films by atomic force microscopy

被引:12
作者
Kim, Y
Jiang, L
Iyoda, T
Hashimoto, K
Fujishima, A
机构
[1] UNIV TOKYO,FAC ENGN,DEPT APPL CHEM,BUNKYO KU,TOKYO 113,JAPAN
[2] TOKYO INST POLYTECH,KAST LAB,PHOTOCHEM CONVERS MAT PROJECT,ATSUGI,KANAGAWA 24302,JAPAN
关键词
atomic force microscopy; C-60; fullerene films; surface reconstruction;
D O I
10.1016/S0039-6028(97)00344-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Reconstructed surfaces of C-60 epitaxial films on KBr(001) substrates were directly observed by atomic force microscopy (AFM). AFM images showed ridge-like fringes running along the three equivalent [1(1) over bar0$] directions on the face-centered cubic (fcc) (111) face on the surfaces of C-60 thick (> 500 nm) films. Molecular-resolution images revealed that the raised fringe region is contracted by ca 3% in the [11(2) over bar] direction and that the vertical displacement of the fringe is 0.30+/-0.02 nm. The observations suggest a stacking-fault-domain model involving periodic transitions between fee (ABCABC... stacking) and hexagonal close-packed (hcp, ABAB... stacking) structures. Fcc surface domains were proposed to exist on the wider areas between fringes on the C-60 film surface based on the fact that the fcc bulk structure is energetically slightly more favorable than that of hcp. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:L945 / L951
页数:7
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