共 24 条
[2]
[Anonymous], SEMICOND SCI TECHNOL
[4]
Failure and stabilization mechanisms of graphite electrodes
[J].
JOURNAL OF PHYSICAL CHEMISTRY B,
1997, 101 (12)
:2195-2206
[8]
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy
[J].
OPTICS EXPRESS,
2009, 17 (25)
:22351-22357
[9]
Raman microprobe mapping of residual and bridging stress fields in AlN ceramics
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2002, 326 (02)
:261-269