Nucleation- or growth-controlled orientation development in chemically derived ferroelectric lead zirconate titanate (Pb(ZrxTi1-x)O-3, x=0.4) thin films

被引：92

作者：

Liu, YM ^{[1
]}

Phule, PP ^{[1
]}

机构：

[1] UNIV PITTSBURGH,DEPT MAT SCI & ENGN,PITTSBURGH,PA 15261

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1996年 / 79卷 / 02期

关键词：

Experimental; (EXP);

D O I：

10.1111/j.1151-2916.1996.tb08151.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The profound influence of low-temperature processing steps, hitherto assumed benign from the viewpoint of texture development, is reported. On inclusion of a 400 degrees C step and further heat treatment at 700 degrees C, PZT (40/60) sol-gel thin films with a strong (111) texture were obtained. When the 400 degrees C step was excluded, the films exhibited a strong (100) texture. The (111) PZT texture development is nucleation-controlled and is attributed to the solid-phase epitaxial effect. The (100) texture is considered growth-controlled in that (100) oriented grains grow preferentially so as to minimize surface energy.

引用

页码：495 / 498

页数：4

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