Dual role of LiF as a hole-injection buffer in organic light-emitting diodes

被引:69
作者
Zhao, JM [1 ]
Zhang, ST [1 ]
Wang, XJ [1 ]
Zhan, YQ [1 ]
Wang, XZ [1 ]
Zhong, GY [1 ]
Wang, ZJ [1 ]
Ding, XM [1 ]
Huang, W [1 ]
Hou, XY [1 ]
机构
[1] Fudan Univ, Inst Adv Mat, Natl Key Lab, Surface Phys Lab, Shanghai 200433, Peoples R China
关键词
D O I
10.1063/1.1695444
中图分类号
O59 [应用物理学];
学科分类号
摘要
It is demonstrated experimentally that the effect of a LiF buffer layer inserted at the ITO\N,N'-bis(1-naphthyl)-N,N'-diphenyl-1,1' biphenyl 4,4(')-dimaine (NPB) interface on the hole injection is greatly dependent on the initial barrier height (IBH) existing at the interface. Only for a large IBH, will the introduction of the LiF show improvement effect. For small one, it will weaken the hole injection. These phenomena are explained in terms of tunneling model and calculations based on this model show a good agreement with the experimental results. This further confirms that the energy level realignment and the change in carrier tunneling probability are mainly responsible for the variation of current injection induced by the insulating buffers in organic light-emitting diodes. (C) 2004 American Institute of Physics.
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页码:2913 / 2915
页数:3
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