Morphology of ultrathin CdSe quantum confinement layers in ZnSe matrices

被引:9
作者
Chinyama, KG
O'Donnell, KP
Rosenauer, A
Gerthsen, D
机构
[1] Univ Strathclyde, Dept Phys & Appl Phys, Glasgow G4 0NG, Lanark, Scotland
[2] Univ Karlsruhe, D-7500 Karlsruhe, Germany
关键词
morphology; interfacial roughness; compositional roughness; local lattice parameter; local displacement;
D O I
10.1016/S0022-0248(99)00099-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Using a combination of transmission electron microscopy (TEM). high resolution TEM (HRTEM), digital analysis of lattice images (DALI), and correspondence analysis (CA) we present at near-atomic resolution the morphology of a nominal 2 monolayer (ML) cadmium selenide (CdSe) quantum well (QW) between ZnSe barriers. We reveal the presence of similar to 10 hit zinc cadmium selenide (ZnxCd1-xSe) alloy insertion layer of varying composition in a ZnSe matrix, A spotty pattern in the plane of the layer indicates the presence of self-assembled clusters or islands similar to the structures commonly referred to as quantum dots. Further analysis indicates that these clusters, of less than 10 nm in lateral extent, themselves contain sites highly saturated with CdSe. Analysis of photoluminescence (PL) spectra suggests that the emission originates predominantly from excitons trapped in these islands. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:362 / 370
页数:9
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