Probing nanoscale dipole-dipole interactions by electric force microscopy -: art. no. 166101

被引：50

作者：

Mélin, T ^{[1
]}

Diesinger, H ^{[1
]}

Deresmes, D ^{[1
]}

Stiévenard, D ^{[1
]}

机构：

[1] CNRS, UMR 8520, Inst Electron Microelectron & Nanotechnol, F-59652 Villeneuve Dascq, France

来源：

PHYSICAL REVIEW LETTERS | 2004年 / 92卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.92.166101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We address the issue of dipole-dipole interaction measurements at the nanometer scale. Electric dipoles with tunable effective momentum in the range 10(3)-10(4) D are generated by charge injection in single silicon nanoparticles on a conductive substrate and probed by a spectroscopic electric force microscopy analysis. Weak dipole-dipole force gradients are measured and identified from their quadratic momentum dependence. The results suggest that dipolar interactions associated with atomic-scale charge displacements or molecules can be probed by noncontact atomic force microscopy.

引用

页码：166101 / 1

页数：4

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