Electric force microscopy of individually charged nanoparticles on conductors:: An analytical model for quantitative charge imaging -: art. no. 035321

被引：80

作者：

Mélin, T ^{[1
]}

Diesinger, H ^{[1
]}

Deresmes, D ^{[1
]}

Stiévenard, D ^{[1
]}

机构：

[1] CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

来源：

PHYSICAL REVIEW B | 2004年 / 69卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.69.035321

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We address in this paper the issue of quantitative charge imaging of individually charged semiconductor nanoparticles on conductive substrates by electric force microscopy (EFM). An analytical model is proposed for arbitrary tip and nanoparticle geometries to determine the amount of stored charges from the ratio R between the nanoparticle charge and capacitive force gradients. The quantitative character of the model is validated by extensive numerical calculations of EFM signals using various nanoparticle shapes, sizes, and aspect ratios, and different EFM tip geometries.

引用

页数：8

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MELIN T, UNPUB

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