C60 cluster formation at interfaces with pentacene thin-film phases

被引:21
作者
Conrad, B. R. [1 ,2 ]
Tosado, J. [1 ,2 ]
Dutton, G. [3 ]
Dougherty, D. B. [3 ]
Jin, W. [2 ,4 ]
Bonnen, T. [3 ]
Schuldenfrei, A. [3 ]
Cullen, W. G. [1 ,2 ]
Williams, E. D. [1 ,2 ]
Reutt-Robey, J. E. [2 ,4 ]
Robey, S. W. [3 ]
机构
[1] Univ Maryland, Dept Phys, College Pk, MD 20742 USA
[2] Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA
[3] NIST, Gaithersburg, MD 20899 USA
[4] Univ Maryland, Dept Chem & Biochem, College Pk, MD 20742 USA
关键词
atomic clusters; atomic force microscopy; organic semiconductors; photoemission; scanning tunnelling microscopy; SOLAR-CELLS; BAND-GAP; SURFACES; GROWTH; OXIDATION; METAL;
D O I
10.1063/1.3266857
中图分类号
O59 [应用物理学];
学科分类号
摘要
The C-60-thin film pentacene interface was investigated using scanning tunneling microscopy, atomic force microscopy, and ultraviolet photoemission spectroscopy. C-60 deposition on a multilayer pentacene film (standing) yields an interface dominated by C-60 clusters, regardless of the underlying substrate. Three-dimensional cluster growth dominates due to weak interactions with the underlying Pn. C-60 cluster size and density on sequential Pn layers suggest an Ehrlich-Schwoebel-type barrier at Pn layer boundaries. Cluster formation reduces the C-60 lowest unoccupied molecular orbital-Pn highest occupied molecular orbital (HOMO) separation, while increasing the respective HOMO-HOMO offset. Heterostructure fabrication protocols can alter interface morphology and induce band shifts on the order of 0.3 eV.
引用
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页数:3
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