共 30 条
Percolative effects on noise in pentacene transistors
被引:39
作者:

Conrad, B. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Cullen, W. G.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Yan, W.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Williams, E. D.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Dept Phys, College Pk, MD 20742 USA
机构:
[1] Univ Maryland, Dept Phys, College Pk, MD 20742 USA
关键词:
D O I:
10.1063/1.2823577
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Noise in pentacene thin film transistors has been measured as a function of device thickness from well above the effective conduction channel thickness to only two conducting layers. Over the entire thickness range, the spectral noise form is 1/f, and the noise parameter varies inversely with gate voltage, confirming that the noise is due to mobility fluctuations, even in the thinnest films. Hooge's parameter varies as an inverse power law with conductivity for all film thicknesses. The magnitude and transport characteristics of the spectral noise are well explained in terms of percolative effects arising from the grain boundary structure. (c) 2007 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 30 条
[1]
The 1/f noise of InP based 2DEG devices and its dependence on mobility
[J].
Berntgen, J
;
Heime, K
;
Daumann, W
;
Auer, U
;
Tegude, FJ
;
Matulionis, A
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1999, 46 (01)
:194-203

Berntgen, J
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Halbleitertech, D-52056 Aachen, Germany Inst Halbleitertech, D-52056 Aachen, Germany

Heime, K
论文数: 0 引用数: 0
h-index: 0
机构: Inst Halbleitertech, D-52056 Aachen, Germany

Daumann, W
论文数: 0 引用数: 0
h-index: 0
机构: Inst Halbleitertech, D-52056 Aachen, Germany

Auer, U
论文数: 0 引用数: 0
h-index: 0
机构: Inst Halbleitertech, D-52056 Aachen, Germany

Tegude, FJ
论文数: 0 引用数: 0
h-index: 0
机构: Inst Halbleitertech, D-52056 Aachen, Germany

Matulionis, A
论文数: 0 引用数: 0
h-index: 0
机构: Inst Halbleitertech, D-52056 Aachen, Germany
[2]
Low-frequency noise in polymer transistors
[J].
Deen, MJ
;
Marinov, O
;
Yu, JF
;
Holdcroft, S
;
Woods, W
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
2001, 48 (08)
:1688-1695

Deen, MJ
论文数: 0 引用数: 0
h-index: 0
机构:
McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada

Marinov, O
论文数: 0 引用数: 0
h-index: 0
机构: McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada

Yu, JF
论文数: 0 引用数: 0
h-index: 0
机构: McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada

论文数: 引用数:
h-index:
机构:

Woods, W
论文数: 0 引用数: 0
h-index: 0
机构: McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada
[3]
Organic thin-film transistors: A review of recent advances
[J].
Dimitrakopoulos, CD
;
Mascaro, DJ
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
2001, 45 (01)
:11-27

Dimitrakopoulos, CD
论文数: 0 引用数: 0
h-index: 0
机构: IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA

Mascaro, DJ
论文数: 0 引用数: 0
h-index: 0
机构: IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
[4]
Current noise spectroscopy on mLPPP based organic light emitting diodes
[J].
Ferrari, G
;
Natali, D
;
Sampietro, M
;
Wenzl, FP
;
Scherf, U
;
Schmitt, C
;
Güntner, R
;
Leising, G
.
ORGANIC ELECTRONICS,
2002, 3 (01)
:33-42

Ferrari, G
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Natali, D
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Sampietro, M
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Wenzl, FP
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Scherf, U
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Schmitt, C
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Güntner, R
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

Leising, G
论文数: 0 引用数: 0
h-index: 0
机构: Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy
[5]
Analysis of charge transport in a polycrystalline pentacene thin film transistor by temperature and gate bias dependent mobility and conductance
[J].
Guo, Dong
;
Miyadera, Tetsuhiko
;
Ikeda, Susumu
;
Shimada, Toshihiro
;
Saiki, Koichiro
.
JOURNAL OF APPLIED PHYSICS,
2007, 102 (02)

Guo, Dong
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan

论文数: 引用数:
h-index:
机构:

Ikeda, Susumu
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan

Shimada, Toshihiro
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan

Saiki, Koichiro
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan Univ Tokyo, Grad Sch Frontier Sci, Dept Complex Sci & Engn, Chiba 2778561, Japan
[6]
Growth dynamics of pentacene thin films
[J].
Heringdorf, FJMZ
;
Reuter, MC
;
Tromp, RM
.
NATURE,
2001, 412 (6846)
:517-520

Heringdorf, FJMZ
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Reuter, MC
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Tromp, RM
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[7]
1/F NOISE SOURCES
[J].
HOOGE, FN
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1994, 41 (11)
:1926-1935

HOOGE, FN
论文数: 0 引用数: 0
h-index: 0
机构: Department of Electrical Engineering, Eindhoven University of Technology
[8]
1/F NOISE IS NO SURFACE EFFECT
[J].
HOOGE, FN
.
PHYSICS LETTERS A,
1969, A 29 (03)
:139-&

HOOGE, FN
论文数: 0 引用数: 0
h-index: 0
机构: Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
[9]
Organic thin film transistors: From theory to real devices
[J].
Horowitz, G
.
JOURNAL OF MATERIALS RESEARCH,
2004, 19 (07)
:1946-1962

Horowitz, G
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 07, CNRS, UMR 7086, ITODYS, F-75005 Paris, France Univ Paris 07, CNRS, UMR 7086, ITODYS, F-75005 Paris, France
[10]
Hooge's constant for carbon nanotube field effect transistors
[J].
Ishigami, Masa
;
Chen, J. H.
;
Williams, E. D.
;
Tobias, David
;
Chen, Y. F.
;
Fuhrer, M. S.
.
APPLIED PHYSICS LETTERS,
2006, 88 (20)

Ishigami, Masa
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Dept Phys, College Pk, MD 20742 USA Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Chen, J. H.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Williams, E. D.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Tobias, David
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Chen, Y. F.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Dept Phys, College Pk, MD 20742 USA

Fuhrer, M. S.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Dept Phys, College Pk, MD 20742 USA